Atomic Force Microscopy in Process Engineering An by W. Richard Bowen

By W. Richard Bowen

This can be the 1st e-book to compile either the fundamental thought and confirmed approach engineering perform of AFM. it really is awarded in a fashion that's obtainable and helpful to training engineers in addition to to people who are bettering their AFM abilities and information, and to researchers who're constructing new items and options utilizing AFM.
The ebook takes a rigorous and sensible process that guarantees it's at once acceptable to method engineering difficulties. basics and strategies are concisely defined, whereas particular merits for procedure engineering are in actual fact outlined and illustrated. Key content material contains: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic strength microscopy (AFM) is a vital device for approach engineers and scientists because it permits more suitable strategies and products
- the single booklet facing the idea and functional purposes of atomic strength microscopy in procedure engineering
- presents best-practice counsel and adventure on utilizing AFM for approach and product development

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Additional info for Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Pro

Example text

The Hamaker constant though is not an easily obtained value. Lifshitz theory [11] can be used to calculate the Hamaker constant, but the calculations require complete knowledge of the dielectric spectra over the entire frequency range for all of the individual materials comprising the system. This type of data is not available for most substances, so another method is required for which data is more widely available. Ninham and Parsegian [15] considered the construction of the dielectric spectra for all frequencies and concluded that not all parts of the frequency range are equally important.

Gillies, Revealing contamination on AFM cantilevers by microdrops and microbubbles, Langmuir 20 (2004) 11824–11827. [50] R. Luginbuhl, A. D. -B. M. D. Ratner, Comprehensive surface analysis of hydrophobically functionalized SFM tips, Ultramicroscopy 82 (2000) 171–179. [51] L. O. Tegenfeldt, Direct observation of the tip shape in scanning probe microscopy, Appl. Phys. Lett. 62 (21) (1993) 2628–2630. J. van Loenen, D. J. M. Lenssink, J. Dieleman, Evidence for tip imaging in scanning tunneling microscopy, Appl.

For frictional measurements, as well as knowledge of the normal and torsional spring constants, knowledge of the lateral response of the deflection sensor and the geometry, height and material properties of the probe at the region of contact with the sample need to be ascertained. At this point the difference between the torsional and lateral stiffnesses of the cantilevers must be made clear. The torsional spring constant k is the resistance to rotation along the major axis of the cantilever. The lateral spring constant klat on the contrary is the resistance of the lever to forces experienced laterally at the apex of the probe tip, producing a rotation at the base of the probe.

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